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| Categories | Kerr Microscope |
|---|---|
| Price: | Price Negotiable | Contact us for a detailed quote |
| Payment Terms: | T/T |
| Place of Origin: | CHINA |
| Brand Name: | Truth Instruments |
| Name: | Kerr Microscope |
| Electrical Source Meter: | Keithley 6221,Keithley 2182A |
| In-Plane Magnetic Field: | 1 T@air Gap 5 Mm, 0.5 T@air Gap 10 Mm;, 0.3 T@air Gap 16 Mm |
| Objectives: | 5x,20x,50x,100x,non-magnetic |
| Vertical Magnetic Field: | 0.25 T@single Pole |
| Microsecond Ultrafast PulseVertical Magnetic Field: | 60 MT, Rise Time 0.5 Us, Pulse Width L Us- 10 Us |
| Optical Resolution: | 250 Nm |
| Magnetic Field Resolution: | PiD Closed-loop Feedback Regulation, Resolution 0.05 MT |
| Probe Station: | Compatible With 4 - 8 Sets Of Non-magnetic Probe Holder |
| Company Info. |
| Truth Instruments Co., Ltd. |
| Verified Supplier |
| View Contact Details |
| Product List |
Multifunctional Spin-Test Magneto-Optic Kerr Microscope
KMPL-S
This instrument enables high-resolution magnetic domain imaging of magnetic materials and spintronic chips, with a resolution of up to 250 nm. It is equipped with a highly intelligent control system and multifunctional magnetic field probe station, integrating optical imaging, multi-dimensional magnetic fields, electrical transport characterization, microwave testing, and variable temperature modules. With a single button operation, it can observe magnetic dynamics under various excitation conditions, such as magnetic fields, currents, spin-orbit torque, and spin-transfer torque. It features microsecond-level fast-response magnetic fields for high-precision magnetic domain velocity and DMI measurements.
| Optical Resolution: | 250 nm |
| Objectives: | 5x,20x,50x,100x,non-magnetic |
| In-Plane Magnetic Field: | 1 T@air gap 5 mm; 0.5 T@air gap 10 mm; 0.3 T@air gap 16 mm |
| Vertical Magnetic Field: | 0.25 T@single pole |
| Magnetic Field Resolution | PID closed-loop feedback regulation, resolution 0.05 mT |
| Microsecond Ultrafast Pulse Vertical Magnetic Field | 60 mT, rise time 0.5μs, pulse width l μs - 10 μs |
| Probe Station | Compatible with 4-8 sets of non-magnetic probe holder |
| Elctrical Source Meter | Keithley 6221, Keithley 2182A |
| Testing Functions | Magnetic domain dynamic observation, global/micro-region hysteresis loop mapping based on Kerrsignals, domain wall velocity measurement, DMl measurement, anomalous Hall resistance, SOT switching, I-R hysteresis loop scanning with synchronized Kerr imaging, and curve mapping of Hallresistance changes in electronic devices under magnetic and current variations, along with corresponding Kerrimages |
Magnetic Domain Distribution in Thin Films
MgO(substrate)/Co/PtSample**: Magnetic defects caused by lattice
mismatch between MgO crystal substrate and Co.
Poor-Quality Magnetic Films**:Snowflake-like magnetic domains during magneti creversal.
High-Quality Magnetic Films**Uniform magnetic domain structures
with smooth edges.
Characterization of local magnetic intrinsic parameters
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